MCQ on Analog Electronics with Answers - 5

Multiple Choice Questions with Answers on Analog Electronics Circuits - 5


          1          Input circuit of CB amplifier is

a.       emitter- base circuit

b.      emitter-collector circuit

c.       base –collector circuit

d.      collector-base-emitter circuit

Answer: a

 

          2          Current gain in CB amplifier is the ratio of

a.       change in IC to change in IE

b.      change in IB to change in IE

c.       change in IE to change in IB

d.      change in IC to change in IB

Answer: a

 

          3          In high frequency hybrid-π model of a CE transistor, the typical value of conductance gm is

a.       10mS

b.      100mS

c.       1000mS

d.      10000mS

Answer: b

 

          4          In high frequency hybrid-π model of a CE transistor, the typical value of CC is

a.       3pF

b.      100pF

c.       1000pF

d.      0.01μF

Answer: a

 

          5          In high frequency hybrid-π model of a CE transistor, the typical value of Ce is

a.       3pF

b.      100pF

c.       1000pF

d.      0.01μF

Answer: b

 

          6          In high frequency hybrid-π model of a CE transistor, the typical value of resistance rb’e is

a.       1000Ω

b.      100Ω

c.       4mΩ

d.      10KΩ

Answer: a

 

          7          In high frequency hybrid-π model of a CE transistor, the typical value of resistance rb’c is

a.       1000Ω

b.      100Ω

c.       4MΩ

d.      10KΩ

Answer: c

 

          8          In a JFET, transconductance is of the order of

a.       1mS

b.      100mS

c.       1S

d.      100S

Answer: a

 

          9          In a JFET, dynamic drain resistance is of the order of

a.       10KΩ

b.      1KΩ

c.       10MΩ

d.      100MΩ

Answer: c

 

        10        In a MOSFET, dynamic drain resistance is of the order of

a.       10KΩ

b.      1KΩ

c.       10MΩ

d.      100MΩ

Answer: a

 

Hope this post on "MCQ on Analog Electronics with Answers-5" will help Electronics Engineering and Electrical Engineering students in preparation of technical interviews, GATE, IES etc.

 

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